Area

Investigation of nanoscale phenomena by AFM

AFM images of nanoscale systems

Atomic Force Microscopy (AFM) is a quantitative three-dimensional high-resolution microscopy technique, belonging to the family of Scanning Probe Techniques, whose predecessor, the scanning tunneling microscope (STM), was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at IBM Research - Zurich, and earned them the Nobel Prize for Physics in 1986.The AFM is one of the foremost tools for imaging, measuring, and manipulating matter at the nanoscale.

The AFM lab was settled in 1999 at the Department of Physics of UNIMI; since then, the research activity of the AFM group has developed along two parallel tracks, closely interwoven: the development and implementation of AFM-based techniques and protocols, and their application to the investigation of nanoscale systems. The activity of the AFM group is well integrated within the interdisciplinary environment of CIMAINA the frame of nano(bio) sciences and technologies.

Related research lines: